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Bruker S8 FABLINET Semiconductor Xray Metrology
{ Bruker S8 FABLINET Semiconductor Xray Metrology }

Bruker S8 FABLINE-T Semiconductor X-ray Metrology

Bruker S8 FABLINE-T Semiconductor X-ray Metrology



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The S8 FABLINE-T is the solution for monitoring trace metal contamination on the wafer surface by TXRF (Total Reflection X-Ray Fluorescence). It is a fast, non-destructive surface sensitive technique that does not require the use of fluids.

-- Products images and contents from Bruker website --
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IAAJ0034-00001EA

S8 FABLINE-T

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