Total reflection X-ray fluorescence (TXRF) spectroscopy is a well-established method for trace element analysis of a variety of samples. The S4 T-STAR simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers.
以上圖片及相關資訊由 Bruker提供。
若有現場安裝、說明或特殊配送需求,歡迎事前與科研市集聯繫。部分商品因供應條件限制,可能無法提供相關服務,敬請見諒。